EssentOptics add new features and capabilities to its trend-setting PHOTON RT spectrophotometer

Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer, EssentOptics continues to work closely with its customers worldwide and add new features improving product performance, measurement results and day-to-day work satisfaction. The upgraded PHOTON RT will be showcased at the coming Laser World of Photonics 2015 exhibition in Munich, Germany (June 22-25, 2015).

Throughout extensive field tests with our customers, we continue to gather great recommendations on product improvements which are not always possible to see from our office. All feedback reports are carefully studied and most of them are realized in our recent product upgrades:

• More than two times improvement of total measurement time for batch (multiple) measurements of samples with coatings at variable angles and polarizations with fixed angle step. With new software features, variable angle measurement with fixed step becomes even more easy. One can simply pre-set the required measurement sequence and let the PHOTON RT do the rest, unattended. The new feature is successfully used for a number of challenging optical measurement applications. One of our customers uses this feature to identify best performing angle of incidence for thin-film polarizer. Another application required to verify optical performance of the broadband mirror within selected range of incident angles.


• In addition to the built-in very useful standard feature to select S, P or average polarization state of the incident beam, the user can select now almost any S/P split ratio, such as, S:P = 20:80, 30:70, 10:90 etc. New feature offers increased opportunities to run measurements immediately with pre-selected polarization ratio of the beam and provides vast data for deeper performance analyses of thin film coating.


• Color selection for gridlines, background, spectrums etc.


• Saving of measurement parameters together with measurement results in xls and txt formats.


• Real time visualization of wavelength position during baseline scan and measurement runs.


• One-click positioning of cursor on the graph at required wavelength.


• Improved signal descretness algorithm offers better visualization for low-signal measurements


• One of the most popular and useful features - Measurement Methods - is also improved. The user can create and save Methods as files in selected folders, and access them through standard pop-up window.

We invite you to visit us at the LASER World of PHOTONICS in Munich and looking forward to meeting you at our booth # 314, Hall B1! Bring your challenging samples, and we will be more than happy to measure them right away.

We are ready to amaze you with our unique UV-VIS-MWIR PHOTON RT spectrophotometer!

E-mail or call us to set up a demo and/or meeting.