EssentOptics will showcase the world’s first PHOTON RT scanning spectrophotometer designed for optical measurement applications with record-setting 190-4900 nm wavelength range. The fully functional instrument will be demonstrated jointly with VM-TIM GmbH, the EssentOptics distributor in Germany, Austria, and Switzerland in Hall 3, booth number B14 at coming Optatec Exhibition in Frankfurt, Germany, May 20-22. The solution offers a focused set of features and capabilities targeted specifically on unattended optical measurement of parts with thin film coatings.
The instrument contains a set of functions providing for fast and accurate unattended optical measurements including absolute specular reflectance, transmittance, variable angle and polarization measurements - all without any additional and costly accessories. Given the growing demand for polarization measurements, this time EssentOptics will present the PHOTON RT with unique 220-4900 nm continuous broadband polarization measurement option. PHOTON RT is the first and only instrument in the industry to feature UV-MWIR polarization measurement capability in a single device, a unique opportunity to get deeper insight into performance data of optical coatings with extreme specifications.
Trustful measurements in the IR range have been a challenge for optical experts for many years. The newly revised optical design of PHOTON RT spectrophotometer is characterized with improved baseline stability and reduced noise providing much improved measurement accuracy in MWIR range even for absolute specular reflectance measurement.
Other application-driven features include calculation of integral values adjusted for type A illumination source and spectral sensitivity of human eye, measurement and calculation of refractive index and layer thickness for single layer homogeneous coatings, unattended measurement of polarizing and beamsplitter cubes, absorptance measurement for sample materials etc.
Additional information:
Optatec Exhibition: visit webpage
PHOTON RT Scanning Spectrophotometer: visit webpage
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